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Film thickness-measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film thickness-measuring apparatus using linearly polarized ligh

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Film-width and transmittance scanner system

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Filter

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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Filter cleaning system for opacity monitor

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Patent

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Filter design for colorimetric measurement

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

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Filter for laser gaging system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Filter indexing for spectrophotometer system

Optics: measuring and testing – By dispersed light spectroscopy – With monochromator structure
Patent

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Filter processing system for the output signal of optical...

Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate

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Filter regulator for microspectrophotometer

Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent

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Filter rotator for coherent optical correlation system

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Filter wheel and method using filters of varying thicknesses

Optics: measuring and testing – By shade or color – With color transmitting filter
Patent

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Filtered calculation of sensor array induced phase angle...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

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Finder scope for use with astronomical telescopes

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

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Fine alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Fine clearance measuring apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Fine movement mechanism unit and scanning probe microscope

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Fine particle analyzing device

Optics: measuring and testing – Sample – specimen – or standard holder or support – Fluid containers
Patent

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Fine particle measuring method and system and a flow cell for us

Optics: measuring and testing – For size of particles – By particle light scattering
Patent

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Fine positioning beam director system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrophotometer
Patent

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