Search
Selected: All

Needle detector for circular knitting machines

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Non-contact optical system for production testing of...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Non-contact vision based inspection system for flat specular...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Non-destructive testing and imaging

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Non-reflecting structures for surface scanners

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Nondestructive method for detecting defects in thin film using s

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Nonlinear optical system for sensing the presence of...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Null balance alphameter

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Object detecting apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Object inspection method utilizing a corrected image to find unk

Optics: measuring and testing – Inspection of flaws or impurities – Containers or enclosures
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Oblique transmission illumination inspection system and...

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Observation apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Off-axis light beam defect detector

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

On-line sliver monitor

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

On-the-fly automatic defect classification for substrates...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Opacity measuring apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Optic probe for semiconductor characterization

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Optic probe for semiconductor characterization

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Optical analysis of biomedical specimens

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Optical apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.