Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2006-04-18
2006-04-18
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Inspection of flaws or impurities
C250S22300B
Reexamination Certificate
active
07030977
ABSTRACT:
The present invention provides a system for the contactless testing and configuring of electronic assemblies during the manufacturing process. The system includes an onboard optical transceiver, a system controller, and a controller optical transceiver. The onboard optical transceiver is located on the electronic assembly. The onboard optical transceiver is connected to an integrated circuit which is capable of performing functional tests or storing programs on the assembly. The controller optical transceiver is connected to the system controller and located adjacent to the electronic assembly. The onboard transceiver and the controller optical transceiver are used to establish a contactless communication link between the system controller and the electronic assembly. The contactless nature of the communication link allows the assembly to be transported past the controller optical transceiver by a simple conveyor while the system controller is communicating with the electronic assembly.
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Baker Jay D.
Schweitzer Charles F.
Shi Zhong-You (Joe)
Zhang William
Brinks Hofer Gilson & Lione
Stafira Michael P.
Valentin, II Juan D.
Visteon Global Technologies Inc.
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