Oblique transmission illumination inspection system and...

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S237100

Reexamination Certificate

active

11284754

ABSTRACT:
An oblique illumination inspection system and method are described herein that are used to identify a defect (e.g., inclusion, onclusion, scratch, stain, blister, cord or other imperfection associated with a surface discontinuity or material non-homogeneity) on or within a glass sheet (e.g., LCD glass substrate).

REFERENCES:
patent: 3971621 (1976-07-01), Albrecht-Buehler
patent: 4492477 (1985-01-01), Leser
patent: 4989973 (1991-02-01), Noso et al.
patent: 5305139 (1994-04-01), Greenberg
patent: 5570228 (1996-10-01), Greenberg
patent: 6084664 (2000-07-01), Matsumoto et al.
patent: 6184977 (2001-02-01), Ishida
patent: 6256091 (2001-07-01), Kobayashi
patent: 6633377 (2003-10-01), Weiss et al.
patent: 2003/0152276 (2003-08-01), Kondo et al.
patent: 2005/0206890 (2005-09-01), Hurst et al.
Abramowitz et al., “Introduction to Oblique Illumination”, (2003), pp. 1-13□□http://micro.magnet.fsu.edu/primer/techniques/oblique/obliqueintro.html.
W.S. Jones, “Introduction to Oblique Illumination”, Molecular Expressions, Optical Microscopy Primer Specialized Techniques, http://micro.magnet.fsu.edu/primer/techniques/oblique/obliqueintro.html, Aug. 1, 2003.
“Modulation Transfer Function Interactive Java Tutorials: Contrast Enhancement Technique MTF Curves”, Molecular Expressions, Optical Microscopy Primer Anatomy of the Microscope, http://microscopy.fsu.edu/primer/java/mtf/contrasttechniques/index.html, 2003.
Galileo Microscopy, “Contrast in Optical Microscopy”, Molecular Expressions, Optical Microscopy Primer Specialized Techniques, http://micromagnet.fsu.edu/primer/techniques/contrast.html, Aug. 1, 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Oblique transmission illumination inspection system and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Oblique transmission illumination inspection system and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Oblique transmission illumination inspection system and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3902829

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.