LandOfFree - US Patents - Listing for Optics: measuring and testing,Inspection of flaws or impurities

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Wafer inspection systems and methods for analyzing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Wafer inspection systems and methods for analyzing...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Wafer inspection using optimized geometry

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Wafer inspection using short-pulsed continuous broadband...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Wafer inspection with a customized reflective optical...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Wafer metrology apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Wafer surface inspection apparatus and wafer surface...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Wafer surface inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Window defect planar mapping technique

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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Windshield soil detector

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection

Patent

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Workpiece levitation using alternating positive and negative...

Optics: measuring and testing – Inspection of flaws or impurities

Reexamination Certificate

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Wound web roll sidewall quality measurement

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

Patent

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