Window defect planar mapping technique

Details Window defect planar mapping technique Window defect planar mapping technique

1975-03-14

1976-10-12

McGraw, Vincent P.

Optics: measuring and testing

Inspection of flaws or impurities

Having predetermined light transmission regions

356239, G01N 2116, G01N 2132

Patent

active

039854540

ABSTRACT:
A method of planar mapping defects in a window having an edge surface and a planar surface. The method comprises of steps of mounting the window on a support surface. Then a light sensitive paper is placed adjacent to window surface. A light source is positioned adjacent the window edge. The window is then illuminated with the source of light for a predetermined interval of time. Defects on the surface of the glass, as well as in the interior of the glass are detected by analyzing the developed light sensitive paper. The light source must be in the form of optical fibers or a light tube whose light transmitting ends are placed near the edge surface of the window.

REFERENCES:
patent: 552641 (1896-01-01), Hoskins
patent: 1514386 (1924-11-01), Hitner
patent: 2871756 (1959-02-01), Graves et al.
patent: 3430055 (1969-02-01), Metzger
patent: 3586444 (1971-06-01), Sproul et al.
patent: 3740142 (1973-06-01), Takubo

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