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Arrangement of eliminating erroneous data in three-dimensional o

Optics: measuring and testing – By polarized light examination – With light attenuation
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Array element examination method and array element examination d

Optics: measuring and testing – By polarized light examination – With light attenuation
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Assembly suitable for determining a surface topology of a workpi

Optics: measuring and testing – By polarized light examination – With light attenuation
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Automated measurements and visualization system

Optics: measuring and testing – By polarized light examination – With light attenuation
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Automated optical surface profile measurement system

Optics: measuring and testing – By polarized light examination – With light attenuation
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Automated system utilizing self-labeled target by pitch encoding

Optics: measuring and testing – By polarized light examination – With light attenuation
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Automatic BOF vessel remaining lining profiler and method

Optics: measuring and testing – By polarized light examination – With light attenuation
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Automatic BOF vessel remaining lining profiler and method

Optics: measuring and testing – By polarized light examination – With light attenuation
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