Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1998-06-26
1999-02-02
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
382286, 356241, G01B 1104
Patent
active
058672737
ABSTRACT:
Graphical representations of a machine structure desired to be measured are pre-stored in a video storage device. A user selects dimensions of the machine to be measured through a manual input device. The preferred viewpoints for this measurement are determined by a image creation device. These viewpoints are provided to video storage device to create an image of the machine structure showing the dimension to be measured. An instructional video overlay device receives an indication from the manual input device of the dimension to be measured. It then provides a graphical overlay of a preferred tool to be used and shows its preferred positioning and use on the machine image from image creation device. These are merged by a video merge device and displayed to a user on a display device. The users then selects the tool, positions, and uses it as instructed. When activated by the user, the tool directly provides measurement information to a control device which stores the information, reducing human error. In an alternative embodiment, audio instruction may be added and synchronized with the video instruction.
REFERENCES:
patent: 4974168 (1990-11-01), Marx
patent: 5004339 (1991-04-01), Pryor et al.
patent: 5717455 (1998-02-01), Kamewada
General Electric Company
Pham Hoa Q.
Snyder Marvin
Zale Lawrence P.
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