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Moire topographic measurement

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Monitoring of minimum features on a substrate

Optics: measuring and testing – By polarized light examination – With light attenuation
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Monitoring of minimum features on a substrate

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Monitoring the planarity of metal sheet

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Movable aperture photoelectric measuring instrument

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Movement and position measuring device and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Multi-axis optical projector

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Multi-beam laser sensor for semiconductor lead measurements

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Multi-channel position detection system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Multi-dimensional position sensor using range detectors

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Multi-track analog optical sensing system and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Multiple points distance measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Multiple-beam optical position sensor for automotive occupant de

Optics: measuring and testing – By polarized light examination – With light attenuation
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Multiple-scan method for wafer particle analysis

Optics: measuring and testing – By polarized light examination – With light attenuation
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Multitrack multilevel sensing system

Optics: measuring and testing – By polarized light examination – With light attenuation
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Multitrack multilevel sensing system with error detecting

Optics: measuring and testing – By polarized light examination – With light attenuation
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