Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-02-11
1998-04-07
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, 25055922, G01B 1124
Patent
active
057370834
ABSTRACT:
An optical sensor system for measuring the approximate three-dimensional profile and position of an object. A reduced to practice embodiment of the optical sensor system has been used to measure the three-dimensional profile and position of an object within a range of 40 inches to 2 inches with high accuracy and high update rates (>1 KHz). The sensor system generates a set of optical beams using a projection lens and multiple light emitting diodes (LED) located in a back focal plane of the projection lens. The position of each LED determines the angle of a beam transmitted thereby. By turning on each LED sequentially in time, a set of beams is generated at various angles that illuminates the object to produce a set of spots on the object. The range from each LED to each of the spatially-separated illuminated spots on the object is determined by imaging the spots onto a two-dimensional transverse-effect photodiode. Signals derived from a pair of photocurrent outputs from the photodiode are processed to determine the positions of the spots on the two-dimensional transverse-effect photodiode. Computations are performed that implement optical triangulation to determine the range and approximate three-dimensional profile to the object.
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Owechko Yuri
Przytula K. Wojtek
Delco Electronics Corporation
Font Frank G.
Funke Jimmy L.
Smith Zandra V.
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