Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1987-11-19
1989-12-05
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
33 1M, 33503, 356373, G01B 1100
Patent
active
048848891
ABSTRACT:
A calibration system for measuring the parametric errors in a coordinate measuring machine having a first element and a table which are movable in three dimensions relative to each other. The apparatus comprises a reflector assembly attachable to the first element, a laser measuring assembly attachable to the table for directing a plurality of laser beams at the reflector assembly and for sensing laser beams reflected from the reflector assembly and generating displacement, straightness, pitch, yaw and roll error signals, and means for mounting the laser measuring assembly to the table in three different orientations and for mounting the reflector assembly to the first element in three different orientations. In each of the orientations, the reflector assembly and the laser measuring assembly are aligned for measurement of parametric errors at a plurality of selected positions along the direction of the laser beam. The parametric errors along each direction of movement are stored in a computer. When a part is measured with the machine, the total errors are calculated at each measurement point, and the errors are subtracted from the scale readings.
REFERENCES:
patent: 2924768 (1960-02-01), Farrand et al.
patent: 3551055 (1970-12-01), Chitayat
patent: 3622244 (1971-11-01), Chitayat
patent: 3715599 (1973-02-01), Marcy
patent: 3765772 (1973-10-01), Willett
patent: 3790284 (1974-02-01), Baldwin
patent: 3884580 (1975-05-01), Webster et al.
patent: 4215938 (1980-08-01), Farrand et al.
patent: 4261107 (1981-04-01), Coleman et al.
patent: 4276698 (1981-07-01), Dore et al.
patent: 4500200 (1985-02-01), Kleinhans
"Calibration of a Machine Tool", Laser Measurement System, Application Note 156-4, Hewlett-Packard.
Brown & Sharpe Manufacturing Company
Evans F. L.
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