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Testing device included in the electrooptic device

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Testing electrical circuits

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
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Testing electrical integrity of electrically heated subsea...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
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Testing electromagnetic shielding effectiveness of shielded encl

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

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Testing flat panel display plates using high frequency AC...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing integrated circuits and integrated power transistors

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing method and apparatus for flat panel displays using infra

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Testing method and testing apparatus for liquid crystal panel

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing method for a substrate of active matrix display panel

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing method for array substrate

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing method for array substrate

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing method for imaging defects in a liquid crystal display s

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Testing method for LCD panels

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing method, semiconductor device, and display apparatus

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing method/arrangement measuring electromagnetic...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
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Testing method/arrangement measuring electromagnetic...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
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Testing series passive components without contacting the driven

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Testing system for power supply

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Testing target resistances in circuit assemblies

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Tests for non-linear distortion using digital signal processing

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reissue Patent

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