Testing method for array substrate

Details Testing method for array substrate Testing method for array substrate

2007-05-01

2007-05-01

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

11329124

ABSTRACT:
A testing method for an array substrate is disclosed which includes a first measuring step of operating a line electrode driver circuit15and a row electrode driver circuit16like in a normal display mode while implementing writing in/reading out of a test video signal to and from supplemental capacitors13, and a second measuring step of implementing writing in/reading out of the test video signals to and from a video bus163while rendering TFTs11of a pixel section18and analog switches162of the row electrode driver circuit16to be held turned off. Obtaining a difference between a measured result of the first measuring step and a measured result of the second measuring step allows only a pixel component and a row electrode component with no driver component to be derived, whereupon discrimination is implemented for the presence of or the absence of electric defects in the pixel section.

REFERENCES:
patent: 5576730 (1996-11-01), Shimada et al.
patent: 6525556 (2003-02-01), Matsueda
patent: 6630840 (2003-10-01), Tomita
patent: 6891532 (2005-05-01), Nara et al.
patent: 7106089 (2006-09-01), Nakano et al.
patent: 2005/0093567 (2005-05-01), Nara et al.

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