Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-10-17
2006-10-17
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07123044
ABSTRACT:
A method for testing a semiconductor substrate forming a liquid crystal display device, which method enables a potential change corresponding to a defective condition of pixel cell driving circuits to be detected accurately even when a ratio of pixel capacitance to wiring capacitance is lowered with decrease in size or increase in definition of the liquid crystal display device. The method includes: a charge retaining step for making pixel capacitances connected to a plurality of pixel switches selected from all pixel switches connected to one data line retain charge; and a detecting step for simultaneously detecting the charge retained in a plurality of the pixel capacitances in the charge retaining step from the one data line.
REFERENCES:
patent: 5113134 (1992-05-01), Plus et al.
patent: 5233448 (1993-08-01), Wu
patent: 5377030 (1994-12-01), Suzuki et al.
patent: 5539326 (1996-07-01), Takahashi et al.
patent: 5576730 (1996-11-01), Shimada et al.
patent: 5994916 (1999-11-01), Hayashi
patent: 57-38498 (1982-03-01), None
patent: 01-101646 (1989-04-01), None
patent: 05-005866 (1993-05-01), None
patent: 08-184845 (1996-07-01), None
patent: 2000-304796 (2000-11-01), None
Abe Hitoshi
Akimoto Osamu
Ando Naoki
Orii Toshihiko
Hollington Jermele
Nguyen Tung X.
Sonnenschein Nath & Rosenthal LLP
Sony Corporation
LandOfFree
Testing method, semiconductor device, and display apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing method, semiconductor device, and display apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing method, semiconductor device, and display apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3658059