Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-01-17
2006-01-17
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S754120, C324S501000
Reexamination Certificate
active
06987400
ABSTRACT:
Methods of and apparatus for detecting pixel element defects in flat panel display (FPDs). Floating pixel elements (FPes) of uncompleted active plates in a manufacturing process are activated with high frequency AC test signals having frequencies higher than frequencies encountered by pixels of completely manufactured FPDs during normal display operation. Application of such high frequency test signals allows detection of pixel defects of pixel elements that exhibit an electrical open circuit at normal display operation frequencies. Because the methods and apparatus allow testing prior to FPD plates being completely manufactured and prior to FPD final assembly, pixel defects can be detected early in the display manufacturing process, thereby resulting in a substantial reduction in production costs.
REFERENCES:
patent: 5057775 (1991-10-01), Hall
patent: 5081687 (1992-01-01), Henley et al.
patent: 5170127 (1992-12-01), Henley
patent: 5285150 (1994-02-01), Henley et al.
patent: 5363037 (1994-11-01), Henley et al.
patent: 5369432 (1994-11-01), Kennedy
patent: 5548357 (1996-08-01), Appel et al.
patent: 5614839 (1997-03-01), Bosacchi
patent: 5650844 (1997-07-01), Aoki et al.
patent: 5734158 (1998-03-01), Nagashima et al.
patent: 5781258 (1998-07-01), Dabral et al.
patent: 5793221 (1998-08-01), Aoki
patent: 5852480 (1998-12-01), Yajima et al.
patent: 5914764 (1999-06-01), Henderson
patent: 5982190 (1999-11-01), Toro-Lira
patent: 5994916 (1999-11-01), Hayashi
patent: 6033281 (2000-03-01), Toro-Lira
patent: 6056448 (2000-05-01), Sauter et al.
patent: 6090545 (2000-07-01), Wohlstadter et al.
patent: 6140045 (2000-10-01), Wohlstadter et al.
patent: 6150833 (2000-11-01), Lin et al.
patent: 6232616 (2001-05-01), Chen et al.
patent: 6249329 (2001-06-01), Dabral et al.
patent: 6281701 (2001-08-01), Yang et al.
patent: 6353466 (2002-03-01), Park
patent: 6417686 (2002-07-01), Yaniv et al.
patent: RE37847 (2002-09-01), Henley et al.
patent: 6552563 (2003-04-01), Yaniv et al.
Schmid et al., “Testing LCD Matrixes with E-Beams”, Jun. 1, 2001, Applied Materials-AKT Feldkirchen, Germany, 4 pp.
Panelvision Technologies
Tang Minh N.
Thelen Reid & Priest LLP
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