Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-08-14
2010-06-29
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07746094
ABSTRACT:
A testing system for a power supply (40) includes a testing chamber (10), a control switch, an electrical load (50), an AC source (60), and a PLC (30). The power supply has a voltage choice switch. The testing chamber receives the power supply therein. The testing chamber provides a first or a second ambient temperature and supplies a testing environment for the power supply. The control switch switches the power supply to operate between a standby state and an operational state. The electrical load is connected to the power supply. The AC source is connected to the power supply. The AC source outputs the first voltage or the second voltage to the power supply. The PLC controls switching states of the voltage choice switch and the control switch in a manner such that the power supply selectively operates in one of combined switching states of the voltage choice switch and the control switch.
REFERENCES:
patent: 7362148 (2008-04-01), Okitsu
patent: 7609081 (2009-10-01), Wong et al.
Xie Gui-Feng
Zhang Xin-Ping
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( ShenZhen) Co., Ltd.
Nguyen Trung Q
Niranjan Frank R.
Tang Minh N
LandOfFree
Testing system for power supply does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing system for power supply, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing system for power supply will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4167762