Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-03-03
1998-06-02
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324754, 324755, 324603, G01R 2708
Patent
active
057605963
ABSTRACT:
A method of testing series passive components in electronic assemblies. Only one test pin per passive component is required, thereby reducing the cost and complexity of test fixtures and the electronic assemblies. A passive component is connected between the output of a driving circuit and (optionally) an input of a receiving circuit. The output of the driving circuit is placed in a low impedance state. The receiving end of the passive component is stimulated and the response is measured. For reactive components, the stimulus and response are AC. For resistors, multiple DC measurements may be made. A optional DC bias may be provided to limit DC current and to further reduce the small signal output impedance of the driving circuit.
REFERENCES:
patent: 3873911 (1975-03-01), Champlin
patent: 4651088 (1987-03-01), Sawada
patent: 5467024 (1995-11-01), Swapp
Parker Kenneth P.
Peiffer Ronald J.
Hewlett--Packard Company
Karlsen Ernest F.
Solis Jose M.
Winfield Augustus W.
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