Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-10-13
2008-08-12
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S704000, C324S705000
Reexamination Certificate
active
07411407
ABSTRACT:
A test system includes a circuit assembly having an IC and an external circuit. The IC includes test circuitry used to observe data indicative of target resistances in the external circuit. The test system evaluates the data to determine target resistance values. A first embodiment measures two output voltages responsive to a time varying reference voltage. The two output voltages can be used to determine resistance values in the external circuit. A second embodiment enables logic contention on the IC, controllably fixes a pull-down element on the IC, and controllably sweeps a pull-up element on the IC until the voltage at a node between the pull-down and pull-up elements and coupled to an external circuit exceeds a reference voltage.
REFERENCES:
patent: 5117129 (1992-05-01), Hoffman et al.
patent: 5361032 (1994-11-01), Waterbly
patent: 5682392 (1997-10-01), Raymond et al.
patent: 5796260 (1998-08-01), Agan
patent: 5977775 (1999-11-01), Chandler et al.
patent: 6275962 (2001-08-01), Fuller et al.
patent: 6324485 (2001-11-01), Ellis
patent: 6365859 (2002-04-01), Yi et al.
patent: 6396279 (2002-05-01), Gruenert
patent: 6397361 (2002-05-01), Saitoh
patent: 6448865 (2002-09-01), Miller
patent: 6456124 (2002-09-01), Lee et al.
patent: 6556938 (2003-04-01), Rohrbaugh et al.
patent: 6577980 (2003-06-01), Sheptson et al.
patent: 6586921 (2003-07-01), Sunter
patent: 6658613 (2003-12-01), Rearick et al.
patent: 6661250 (2003-12-01), Kim et al.
patent: 6725171 (2004-04-01), Baur et al.
patent: 6762614 (2004-07-01), Rearick et al.
patent: 6963212 (2005-11-01), Brown
Bell Jacob L.
Rearick Jeffrey R.
Agilent Technologie,s Inc.
Dole Timothy J
LandOfFree
Testing target resistances in circuit assemblies does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing target resistances in circuit assemblies, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing target resistances in circuit assemblies will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3999202