LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

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Method of designing primer and probe sets, primer and probe...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical

Reexamination Certificate

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Method of designing probe from polynucleotide group...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical

Reexamination Certificate

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Method of designing probe from polynucleotide group...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical

Reexamination Certificate

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Method of designing probe set, microarray having substrate...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical

Reexamination Certificate

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Method of designing subband digital filter bank

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Patent

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Method of detecting a fault in a monitored section of an...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method of detecting a pattern and an apparatus thereof

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Method of detecting a reference zone arranged on the...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Reexamination Certificate

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Method of detecting an integrated circuit in failure among...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method of detecting an integrated circuit in failure among...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Method of detecting an integrated circuit in failure among...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method of detecting an integrated circuit in failure among...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method of detecting breaks in logging signals relating to a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Reexamination Certificate

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Method of detecting end point of process, end point...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method of detecting fluid flow through a conduit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Method of detecting free fall and apparatus to detect free...

Data processing: measuring – calibrating – or testing – Measurement system – Accelerometer

Reexamination Certificate

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Method of detecting manual trips in an intelligent...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method of detecting nozzle clogging and analytical instrument

Data processing: measuring – calibrating – or testing – Calibration or correction system – Pressure

Reexamination Certificate

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Method of detecting residual capacity of secondary battery

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Method of detecting residue on a polished wafer

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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