Method of detecting an integrated circuit in failure among...

Details Method of detecting an integrated circuit in failure among... Method of detecting an integrated circuit in failure among...

2005-08-16

2005-08-16

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S763010

Reexamination Certificate

active

06931336

ABSTRACT:
A method of detecting a failure in an IC, based on spectrum which is a result of analyzing a frequency of a current running through an IC when a test signal is applied to the IC, including (a) assuming that all ICs under test define a under-test IC set, and testing each one of the ICs in the under-test IC set in a conventional manner; (b) removing ICs judged to be in failure in (a), from the under-test IC set; (c) measuring spectrum of a current supplied from a power source into each one of the ICs in the under-test IC set; (d) calculating both a mean value and standard deviation of the spectrum for the under-test IC set; (e) judging whether an IC is in failure, based on both the mean value and the standard deviation of the spectrum; (f) removing ICs judged to be in failure in (e), from the under-test IC set; and (g) judging the undertest IC set to be in no failure.

REFERENCES:
patent: 5057441 (1991-10-01), Gutt et al.
patent: 5648275 (1997-07-01), Smayling et al.
patent: 5719796 (1998-02-01), Chen
patent: 6024831 (2000-02-01), Hwang et al.
patent: 6246248 (2001-06-01), Yamagishi
patent: 09-33604 (1997-02-01), None
patent: 09-211088 (1997-08-01), None
patent: 10-301843 (1998-11-01), None
patent: 11-2663 (1999-01-01), None
patent: 11-94917 (1999-04-01), None
K. Sakaguchi, “Fault Diagnosis of IC based on Analyzing the Power Spectrum of a Supply Current”,Proceedings of the 1998 IECE General Conference C-12-8, pp. 99.
M. Serra, et al., “Digital IC Testing”,Digital Devices Testing, pp. 1808-1816.

Affiliated with

Also associated with

Rating

Method of detecting an integrated circuit in failure among... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of detecting an integrated circuit in failure among..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of detecting an integrated circuit in failure among... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3471882