Data processing: measuring – calibrating – or testing – Measurement system – Accelerometer
Reexamination Certificate
2011-06-28
2011-06-28
Kundu, Sujoy K (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Accelerometer
C702S108000, C702S113000, C702S127000, C702S142000, C702S189000
Reexamination Certificate
active
07970572
ABSTRACT:
A method of detecting a free fall of a device includes measuring an acceleration of the device, calculating an integral of the acceleration, and determining whether the acceleration is periodic. If the acceleration is not periodic, the integral of the acceleration is compared with a first critical value to determine whether the device falls freely. If the acceleration is periodic, the integral of the acceleration is compared with a second critical value to determine whether the device falls freely. The first and second critical values are different. Since whether the device is periodically accelerated is considered, free fall of the device can be correctly detected, and thus malfunction of the device can be prevented. For example, an unnecessary protection operation for a hard disk drive of the device can be prevented, and thus a user can conveniently use the device.
REFERENCES:
patent: 2007/0225947 (2007-09-01), Suzuki
patent: 2002-100180 (2002-04-01), None
patent: 2002-208239 (2002-07-01), None
patent: 2005-346840 (2005-12-01), None
patent: 2006-0022020 (2006-03-01), None
patent: 10-699898 (2007-03-01), None
Cho Kyu-nam
Shim Jun-Seok
Kundu Sujoy K
Samsung Electronics Co,. Ltd.
Stanzione & Kim LLP
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