LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

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Dynamic relative load rate for fluid systems

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

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Dynamic routing for a measurement system

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means

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Dynamic runtime modification of SCPI grammar

Data processing: measuring – calibrating – or testing – Testing system – Including program set up

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Dynamic test fixture for a vehicle exhaust system capable of...

Data processing: measuring – calibrating – or testing – Measurement system – Accelerometer

Reexamination Certificate

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Dynamic track stiffness measurement system and method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Dynamic voltage controller

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Dynamic water velocity correction

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Reexamination Certificate

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Dynamic waveform resource management

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Dynamic wavelength calibration for spectrographic analyzer

Data processing: measuring – calibrating – or testing – Calibration or correction system – Zero-full scaling

Patent

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Dynamic weight sensing and classification of vehicular...

Data processing: measuring – calibrating – or testing – Measurement system – Weight

Reexamination Certificate

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Dynamic-mode atomic-force-microscope probe (Tip) vibration...

Data processing: measuring – calibrating – or testing – Calibration or correction system – Position measurement

Reexamination Certificate

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Dynamically adaptable semiconductor parametric testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Dynamically adaptable semiconductor parametric testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Dynamically adaptable semiconductor parametric testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Dynamically adaptable semiconductor parametric testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Dynamically characterizing computer system performance by...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Dynamically configurable process for diagnosing faults in...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

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Dynamically tasking one or more surveillance resources

Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping

Reexamination Certificate

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