Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-04-04
2006-04-04
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C702S070000, C714S001000, C714S004110, C714S033000, C714S038110, C714S046000
Reexamination Certificate
active
07024322
ABSTRACT:
A dynamic waveform manager and an application policy are provided to an electronic device that executes an application requiring the use of waveforms accessed from a waveform table characterized by a limited number of entries. The application policy contains waveform sequencing information specific to the application. The application may utilize any number of waveforms that are typically stored in a memory separate from the waveform table. The dynamic waveform manager monitors the execution of the application, and manages loading and unloading of waveforms required by the application into and out of the waveform table such that each waveform required by the application is loaded in the waveform prior to and at least by the time it is needed by the application. The dynamic waveform manager accesses the application policy to reference the waveform sequencing information specific to the application for use in determining when and which waveforms to load and unload to and from the waveform table.
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Hayhow Reid
Kolman Robert S.
Septon Daven Walt
Agilent Technologie,s Inc.
Barlow John
Vo Hien
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