LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing

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Analog continuous time statistical processing

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Analog display of signal swing and logic analyzer thresholds

Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing

Reexamination Certificate

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Analog encoder method for determining distance moved

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination

Reexamination Certificate

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Analog temperature measurement apparatus and method

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system

Reexamination Certificate

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Analog-type measurements for a logic analyzer

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Analog-type measurements for a logic analyzer

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Analysis apparatus and analysis method

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Analysis apparatus, analysis program product and computer...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Analysis method and analyzer

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Analysis method for semiconductor device, analysis system...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Analysis of condition monitoring information

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Analysis of condition monitoring information

Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring

Reexamination Certificate

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Analysis of data processing system performance

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Analysis of DNA

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical

Reexamination Certificate

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Analysis of DNA

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Biological or biochemical

Reexamination Certificate

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Analysis of noise in repetitive waveforms

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Analysis of noise in repetitive waveforms

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Analysis of particles in fluid

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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Analysis of rotating machines

Data processing: measuring – calibrating – or testing – Measurement system – Speed

Reexamination Certificate

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Analysis of statistical attributes for parameter estimation

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Patent

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