Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-06-26
2007-06-26
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C716S030000, C716S030000
Reexamination Certificate
active
11267399
ABSTRACT:
An analysis apparatus capable of analyzing a circuit even when the number of elements handled in a circuit analysis increases includes: a management unit receiving and dividing information into multiple pieces of information; a calculation unit calculating at least any one of a magnitude of an electric field and a magnitude of a magnetic field at a predetermined point of time for each of a circuit board and wiring; a conversion unit mutually converting at least any one of a magnitude of an electric field and a magnitude of a magnetic field and at least any one of a current value and a voltage value; and a circuit analysis unit calculating at least any one of a current value and a voltage value at a predetermined point of time for an element represented by any one of multiple pieces of information divided by the management unit.
REFERENCES:
patent: 2005/0162148 (2005-07-01), Staats
patent: 2003-223426 (2003-08-01), None
patent: 2004-054642 (2004-02-01), None
Toru Uno; “Finite Difference Time Domain Method for Electromagnetic Field and Antenna Analysis” First Edition, Corona Publishing, Mar. 20, 1998; pp. 2-10 with English language translation.
Kiso Tatsuroh
Sagesaka Hiroshi
Barlow John
Conlin David C.
Edwards Angell Palmer & & Dodge LLP
Sharp Kabushiki Kaisha
Tucker David A.
LandOfFree
Analysis apparatus, analysis program product and computer... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Analysis apparatus, analysis program product and computer..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analysis apparatus, analysis program product and computer... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3842989