Analog-type measurements for a logic analyzer

Details Analog-type measurements for a logic analyzer Analog-type measurements for a logic analyzer

2008-05-13

2008-05-13

Cosimano, Edward R (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C324S076110, C324S076120, C324S076380, C324S500000, C324S537000, C324S765010, C702S066000, C702S067000, C702S068000, C702S108000, C702S119000, C702S123000, C702S189000

Reexamination Certificate

active

11435571

ABSTRACT:
A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes a graphical user interface employing a drag-and-drop operation to apply one or more selected analog-type measurements to selected portions of the digital data record. In a second embodiment, a user may designate a particular waveform or data listing by means of a mouse-click. Each of the choices of analog-type measurements can be represented by an icon, or text, or both icon and text. Some of the analog-type measurements, among others, are pulse width, duty cycle, period, frequency, period jitter, and cycle-to-cycle jitter

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