LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Testing system

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Method for testing subscriber access lines

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means

Reexamination Certificate

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Method for testing vehicular mirrors for regulatory...

Data processing: measuring – calibrating – or testing – Testing system

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Method for the analysis and evaluation of measured values of...

Data processing: measuring – calibrating – or testing – Testing system

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Method for the rapid estimation of figures of merit for...

Data processing: measuring – calibrating – or testing – Testing system

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Method for the test of a testing platform

Data processing: measuring – calibrating – or testing – Testing system – Including program set up

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Method for the testing of electronic components taking the...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method for transporting and testing ultra low sulfur diesel

Data processing: measuring – calibrating – or testing – Testing system – Including program set up

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Method for using wafer navigation to reduce testing times of int

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method for verifying cross-sections

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

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Method for verifying sensors installation and determining...

Data processing: measuring – calibrating – or testing – Testing system – Of sensing device

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Method for virtual inspection of virtually machined parts

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

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Method for virtual inspection of virtually machined parts

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

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Method in an integrated circuit (IC) manufacturing process for i

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Patent

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Method in an integrated circuit (IC) manufacturing process for i

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Patent

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