Method of adjusting strobe timing and function testing...

Details Method of adjusting strobe timing and function testing... Method of adjusting strobe timing and function testing...

2007-04-17

2007-04-17

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Signal generation or waveform shaping

C324S765010

Reexamination Certificate

active

10942017

ABSTRACT:
A method of adjusting a strobe timing includes a first determining step in which an output pattern is compared with an expected result pattern at a strobe timing to determine whether the output pattern is matched to the expected result pattern; a variation range setting step in which a variation range of the strobe timing is set when the output pattern is not matched to the expected result pattern; a varying step in which the strobe timing is varied within the variation range; and a second determining step in which the output pattern is compared with the expected result pattern at the varied strobe timing to determine whether the output pattern is matched to the expected result pattern. Based on a result of the comparison, a function test is performed using the strobe timing to determine a pass/fail result of the semiconductor.

REFERENCES:
patent: 5633879 (1997-05-01), Potts et al.
patent: 5659553 (1997-08-01), Suzuki
patent: 6532561 (2003-03-01), Turnquist et al.
patent: 6609077 (2003-08-01), Brown et al.
patent: 7010729 (2006-03-01), Doi et al.
patent: 2001/0007972 (2001-07-01), Araki et al.
patent: 2004/0216005 (2004-10-01), Pramanick et al.
patent: 7244133 (1995-09-01), None

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