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Method and device for in situ layer thickness determination

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Reexamination Certificate

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Method and device for measuring the thickness of an insulating c

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent

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Method and equipment for measurement and regulation of quantity

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method and system for a vacuum evaporative deposition process

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for applying optical interference coating

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for automatically coating objects with a plurality of qua

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for color making insulated electrical conductors

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for continuously polarizing thermoplastic film

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for controlling accurate dispensing of adhesive droplets

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for controlling wet film thickness of clear coatings...

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for determining direction-dependent properties of...

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for determining silicon content in layers of aluminum and

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for determining thickness of chemical vapor deposited lay

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for developing electrostatic latent images

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for developing latent electrostatic images

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for electric recording

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for electroless deposition of copper on conductive surfac

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for electroless plating

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for expeditiously processing a sodium-potassium-cesium-an

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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Method for fabricating a gradient refractive index optical filte

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
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