4. Electricity: measuring and testing
  5. Measuring, testing, or sensing electricity, per se
  6. With rotor

Yasuyuki Nozuyama

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Apparatus and method for calculating fault coverage, and...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Testing or evaluating
Reexamination Certificate

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Apparatus and method for minimizing the delay times in a semicon

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Patent

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Apparatus connectable to a computer network for circuit...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Apparatus for analyzing fault of semiconductor integrated...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Apparatus for creating test pattern and calculating fault...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Profile ID: LFUS-PAI-P-24274

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