4. Static information storage and retrieval
  5. Addressing
  6. Multiple port access

Michael Richard Ouellette

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Enabling memory redundancy during testing

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Enhanced built-in self-test circuit and method

Excavating
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High density two port SRAM cell for low voltage CMOS application

Static information storage and retrieval – Addressing – Multiple port access
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Method and apparatus for increasing fuse programming yield...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Method and apparatus for initializing an integrated circuit...

Electronic digital logic circuitry – Multifunctional or programmable
Reexamination Certificate

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Profile ID: LFUS-PAI-P-946376

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