Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2007-07-31
2007-07-31
Ton, David (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S718000
Reexamination Certificate
active
10908033
ABSTRACT:
Integrated circuit memory is tested to discover defective memory elements. To replace the defective memory elements, spare memory elements are selected and a string is generated to indicate which ones of the spares replace which ones of the defective memory elements. The number of bits of the string depend upon how many of the memory elements are defective. Although a certain number of the memory elements are defective, which determines the number of the string bits, nevertheless, a number of fuses to program on the integrated circuit is determined responsive to how many fuses are available for programming relative to the number of the binary string bits. That is, if more fuses are available than a certain threshold number relative to the number of string bits (as is preferred), then more than the threshold number are programmed. If not, then only that certain threshold number of fuses are programmed.
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“Yield Enhancement by Optimum Use of Redundant Bit Lines,” IBM TDB, vol. 32, No. 4A, Sep. 1989, pp. 387-388.
Anand Darren Lane
Ouellette Michael Richard
Ziegerhofer Michael Anthony
England Anthony V. S.
Harding W. R.
International Business Machines - Corporation
Ton David
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