Enabling memory redundancy during testing

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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C714S006130, C365S200000

Reexamination Certificate

active

07930592

ABSTRACT:
A design structure embodied in a machine readable medium for designing, manufacturing, testing and/or enabling a redundant memory element (20) during testing of a memory array (14), and a method of repairing a memory array.

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patent: 7076754 (2006-07-01), Miyamoto
patent: 2003/0126512 (2003-07-01), Tzeng
patent: 4-228196 (1992-08-01), None
European Patent Office Search Report, Antonio Operti, application No. 02 797 402.1-2210, Nov. 10, 2006, pp. 1-5.

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