4. Measuring and testing
  5. Specimen stress or strain, or testing by stress or strain...
  6. By loading of specimen

Kim Marie Vo

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Capped dual metal gate transistors for CMOS process and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Circuit for a low power mode

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Reexamination Certificate

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Method for forming a packaged semiconductor device having a...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor
Reexamination Certificate

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Method for forming a semiconductor device having a notched...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate

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Multiple layer strain gauge

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2208106

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