4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Particular stable state circuit

Daniel W. Krueger

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High reliability memory element with improved delay time

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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High reliability triple redundant latch with voting logic on...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – With electrical circuit layout
Reexamination Certificate

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High reliability triple redundant latch with voting logic on...

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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Triple redundant latch design using a fail-over mechanism...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit
Reexamination Certificate

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Triple redundant latch design with low delay time

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2820798

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