4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Leah M. P. Pastel

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Canary device for failure analysis

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Circuit and method for monitoring defects

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Defect diagnosis for semiconductor integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Designing scan chains with specific parameter sensitivities...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Incremental fault dictionary

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2687019

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