4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Erik A. Nelson

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Duty-cycle-efficient SRAM cell test

Static information storage and retrieval – Read/write circuit – Testing
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Method and system for merging multiple fuse decompression...

Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate

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Method for guaranteeing a minimum data strobe valid window...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Data formatting to improve error detection correction...
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Method for testing and guaranteeing that skew between two...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
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Method for testing embedded DRAM arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Profile ID: LFUS-PAI-P-2463447

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