4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Thomas E. Obremski

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Method and apparatus for ram built-in self test (BIST)...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Method for testing embedded DRAM arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method for testing embedded DRAM arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Programmable built-in self test (BIST) data generator for...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Testing logic and embedded memory in parallel

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2464530

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