4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Electrical characteristic sensed

Donald L. Wheater

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Arrangement for testing semiconductor chips while...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Built in self test method and structure for analog to...

Coded data generation or conversion – Converter calibration or testing
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Built-in self-test for analog to digital converter

Coded data generation or conversion – Converter calibration or testing
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Deterministic random LBIST

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Diagnostic method and apparatus for non-destructively...

Electrical pulse counters – pulse dividers – or shift registers: c – Shift register – Particular transfer means
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Profile ID: LFUS-PAI-P-1717093

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