David Ton

Examiner

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Examiner

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AC scan diagnostic method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Access time measurement circuit and method

Electrical computers and digital processing systems: memory – Storage accessing and control – Access timing
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Adaptive fault diagnosis of compressed test responses

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Adaptive FEC codeword management

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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Adaptive runtime repairable entry register file

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Profile ID: LFUS-PAI-P-77295

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