4. Excavating

Woo-seop Kim

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High-speed disturb testing method and word line decoder in semic

Excavating
Patent

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Semiconductor device, test board for testing the same, and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor package having improved heat spreading...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1059222

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