No-disturb bit line write for improving speed of eDRAM

Static information storage and retrieval – Read/write circuit – Precharge

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S189160, C365S149000, C365S210130

Reexamination Certificate

active

07952946

ABSTRACT:
A method of operating a memory circuit includes providing the memory circuit. The memory circuit includes a memory cell; a word line connected to the memory cell; a first local bit line and a second local bit line connected to the memory cell; and a first global bit line and a second global bit line coupled to the first and the second local bit lines, respectively. The method further includes starting an equalization to equalize voltages on the first and the second local bit lines; stopping the equalization; and after the step of starting the equalization and before the step of stopping the equalization, writing values from the first and the second global bit lines to the first and the second local bit lines.

REFERENCES:
patent: 6839268 (2005-01-01), Osada et al.
patent: 2005/0174859 (2005-08-01), Mori et al.
patent: 2008/0117698 (2008-05-01), Hsu

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

No-disturb bit line write for improving speed of eDRAM does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with No-disturb bit line write for improving speed of eDRAM, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and No-disturb bit line write for improving speed of eDRAM will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2688060

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.