4. Semiconductor device manufacturing: process
  5. Bonding of plural semiconductor substrates

Taiwan Semiconductor Manufacturing Company , Ltd.

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3-parameter switching technique for use in MRAM memory arrays

Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate

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3-parameter switching technique for use in MRAM memory arrays

Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate

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Abatement of electron beam charging distortion during dimensiona

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Abatement of electron beam charging distortion during dimensiona

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Accurate parasitic capacitance extraction for ultra large...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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