Deposition process for high aspect ratio trenches

Coating processes – Direct application of electrical – magnetic – wave – or... – Plasma

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C427S576000, C427S099300

Reexamination Certificate

active

07097886

ABSTRACT:
A method of depositing an insulating film over a substrate having a gap formed between two adjacent raised features. The method includes depositing one portion of the insulating film over the substrate and in the gap using a high density plasma process that has simultaneous deposition and sputtering components and depositing another portion of the insulating film over the substrate and in the gap using an atomic layer deposition process. In some embodiments the portion of the film deposited by an atomic layer deposition process is deposited over the portion of the film deposited using a high density plasma CVD technique. In other embodiments, the portion of the film deposited by a high density plasma CVD process is deposited over the portion of the film deposited using an atomic layer deposition process.

REFERENCES:
patent: 4690746 (1987-09-01), McInerney et al.
patent: 4737379 (1988-04-01), Hudgens et al.
patent: 4835005 (1989-05-01), Hirooka et al.
patent: 4890575 (1990-01-01), Ito et al.
patent: 5000113 (1991-03-01), Wang et al.
patent: 5521126 (1996-05-01), Okamura et al.
patent: 5645645 (1997-07-01), Zhang et al.
patent: 5712185 (1998-01-01), Tsai et al.
patent: 5719085 (1998-02-01), Moon et al.
patent: 5804259 (1998-09-01), Robles
patent: 5872058 (1999-02-01), Van Cleemput et al.
patent: 5910342 (1999-06-01), Hirooka et al.
patent: 5916365 (1999-06-01), Sherman
patent: 5976327 (1999-11-01), Tanaka
patent: 5990013 (1999-11-01), Berenguer et al.
patent: 6013191 (2000-01-01), Nasser-Faili et al.
patent: 6013584 (2000-01-01), M'Saad
patent: 6025627 (2000-02-01), Forbes et al.
patent: 6030881 (2000-02-01), Papasouliotis et al.
patent: 6039851 (2000-03-01), Iyer
patent: 6194038 (2001-02-01), Rossum
patent: 6200893 (2001-03-01), Sneh
patent: 6217658 (2001-04-01), Orczyk et al.
patent: 6228751 (2001-05-01), Yamazaki et al.
patent: 6305314 (2001-10-01), Sneh et al.
patent: 6313010 (2001-11-01), Nag et al.
patent: 6342277 (2002-01-01), Sherman
patent: 6355561 (2002-03-01), Sandhu et al.
patent: 6395150 (2002-05-01), Van Cleemput et al.
patent: 6569501 (2003-05-01), Chiang et al.
patent: 6576945 (2003-06-01), Mandelman et al.
patent: 6596654 (2003-07-01), Bayman et al.
patent: 6734082 (2004-05-01), Zheng et al.
patent: 6759675 (2004-07-01), Csutak et al.
patent: 6784096 (2004-08-01), Chen et al.
patent: 6815226 (2004-11-01), Lee et al.
patent: 2001/0002280 (2001-05-01), Sneh
patent: 2001/0028924 (2001-10-01), Sherman
patent: 2001/0041250 (2001-11-01), Werkhoven et al.
patent: 2002/0031618 (2002-03-01), Sherman
patent: 2004/0048461 (2004-03-01), Chen et al.
patent: 442 490 (1991-08-01), None
patent: 526 779 (1993-02-01), None
patent: 2 267 291 (1993-12-01), None
patent: 2-58836 (1990-02-01), None
patent: 7-161703 (1995-06-01), None
patent: WO 00/54320 (2000-09-01), None
patent: WO 01/40541 (2001-06-01), None
patent: WO 01/66832 (2001-09-01), None
patent: WO 00/61833 (2001-10-01), None
“Atomic Layer Deposition” by Physical Inorganic Chemistry, Institute of Applied Synthetic Chemistry, downloaded from website http://www.ias.tuwien.ac.at/research/fghh/research/pic—research—ald.html on Jul. 23, 2002, no page numbers.
George et al., “Atomic layer controlled deposition of SiO2and Al2O3using ABAB . . . binary reaction sequence chemistry,”Applied Surface Science, 82/83:460-467 (1994).
George et al., “Surface Chemistry for Atomic Layer Growth,”J. Phys. Chem.. 100(31) 13121-13131 (1996).
Klaus et al., “Atomic Layer Deposition of SiO2Using Catalyzed and Uncatalyzed Self-Limiting Surface Reactions,”Surface Review and Letters. 6(3/4):435-448 (1999).
Klaus et al., “Atomic layer controlled growth of SiO2films using binary reaction sequence chemistry,”Appl. Phys. Lett.. 70(9):1092-1094 (1997).
Morishita et al., “New substances for atomic-layer deposition of silicon dioxide,”J. Non-Crystalline Solids, 187:66-69 (1995).
Nalwa, H.S.,Handbook of Low and High Dielectric Constant Materials and Their Applications, vol. 1, p. 66 (1999).
Nguyen, S. V., “High-Density Plasma Chemical Vapor Deposition of Silicon-Based Dielectric Films for Integrated Circuits,”Journal of Research and Development, 43(1/2) (1999), pp. 1-17.
Vassiliev et al., “Trends in Void-Free Pre-Metal CVD Dielectrics,”Solid State Technology, pp. 129-136 (2001).
Wise et al., “Diethyldiethoxysilane as a New Precursor for SiO2Growth on Silicon,” fromGas-Phase and SurfaceChemistry in electronic Materials Processing, Mountziaris et al., eds., from Symposium held Nov. 29, 1993 thru Dec. 2, 1993 in Boston Massachusetts, pp. 37-43.
Yamaguchi et al., “Atomic-layer chemical-vapor-deposition of silicon dioxide films with an extremely low hydrogen content,”Applied Surface Science, 130-132:202-207 (1998).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Deposition process for high aspect ratio trenches does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Deposition process for high aspect ratio trenches, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deposition process for high aspect ratio trenches will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3666011

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.