LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application

X-ray or gamma ray systems or devices – Specific application – Mammography

Apparatus, article of manufacture, and method for creation of an

X-ray or gamma ray systems or devices – Specific application – Telescope or microscope

Apparatuses and methods for non-destructive inspection

X-ray or gamma ray systems or devices – Specific application – Absorption

Application specific emission and transmission tomography

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Arbitrary layer tomographic method and apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Arc diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Arc diffractometer

X-ray or gamma ray systems or devices – Specific application – Absorption

ARC-sequencing technique for intensity modulated ARC therapy

X-ray or gamma ray systems or devices – Specific application – Absorption

Architecture for CT scanning system

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Architectures for cardiac CT based on area x-ray sources

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Area detector array for computer tomography scanning system

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Arithmetic unit for a computed tomography apparatus

X-ray or gamma ray systems or devices – Specific application – Mammography

Arrangement and method for means for receiving image data in...

X-ray or gamma ray systems or devices – Specific application – Tomography

Arrangement and method for obtaining imaging data

X-ray or gamma ray systems or devices – Specific application – Tomography

Arrangement and method for obtaining tomosynthesis data

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Arrangement for examining a body comprising a radiation source

X-ray or gamma ray systems or devices – Specific application – Lithography

Arrangement for exposing semiconductor wafers by means of a sync

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Arrangement for measuring the pulse transfer spectrum of elastic

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Arrangement for measuring the pulse transmission spectrum of X-r

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Arrangement for measuring the pulse transmission spectrum of...