X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1997-03-28
1999-10-12
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 79, G01N 2320
Patent
active
059664231
ABSTRACT:
An x-ray diffractometer has an x-ray detector and an x-ray source mounted on vehicles traveling along an arc-shaped track around a sample. The vehicles move independently. Alternatively, the vehicles can move independently on separate parallel tracks.
REFERENCES:
patent: 2991362 (1961-07-01), Schumacher
patent: 3218458 (1965-11-01), Furnas, Jr.
patent: 3816747 (1974-06-01), Kishino
patent: 3868506 (1975-02-01), Ogiso et al.
patent: 4412345 (1983-10-01), Workman et al.
patent: 5155751 (1992-10-01), Chohata et al.
patent: 5187729 (1993-02-01), Ibe et al.
Kerstens Fredericus
Quinn Duncan R.
Barschall Anne E.
Philips Electronics North America Corporation
Porta David P.
LandOfFree
Arc diffractometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Arc diffractometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Arc diffractometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-659651