Arrangement for measuring the pulse transfer spectrum of elastic

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

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378147, G01N 23201

Patent

active

056028938

ABSTRACT:
The invention relates to an arrangement for measuring the pulse transfer spectrum of X-ray quanta using two polychromatic X-ray sources and a detector arrangement which measures the scattered X-ray quanta in an energy-resolved fashion. A secondary diaphragm device, arranged between the examination zone in which the object whose pulse transfer spectrum is to be determined is situated and the detector device, ensures that each detector element of the detector device can be struck by scattered radiation only at a comparatively accurately determined scatter angle. The arrangement in accordance with the invention enables very fast inspection of an object.

REFERENCES:
patent: 5231652 (1993-07-01), Harding
patent: 5394453 (1995-02-01), Harding

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