X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1995-11-21
1997-02-11
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378147, G01N 23201
Patent
active
056028938
ABSTRACT:
The invention relates to an arrangement for measuring the pulse transfer spectrum of X-ray quanta using two polychromatic X-ray sources and a detector arrangement which measures the scattered X-ray quanta in an energy-resolved fashion. A secondary diaphragm device, arranged between the examination zone in which the object whose pulse transfer spectrum is to be determined is situated and the detector device, ensures that each detector element of the detector device can be struck by scattered radiation only at a comparatively accurately determined scatter angle. The arrangement in accordance with the invention enables very fast inspection of an object.
REFERENCES:
patent: 5231652 (1993-07-01), Harding
patent: 5394453 (1995-02-01), Harding
Bruce David Vernon
Porta David P.
Slobod Jack D.
U.S. Philips Corporation
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