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Precision scan position resolver for CT scanners

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Patent

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Predictive organ dynamics database and code

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Preprocessing methods for robust tracking of coronary...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
Reexamination Certificate

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Printed circuit board inspection system combining X-ray...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Printed circuit board inspection system combining X-ray...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Procedure and means for measuring with aid of an x-ray tube the

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Procedure and means for measuring with the aid of a radio-isotop

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Procedure and measuring apparatus based on X-ray diffraction for

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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Procedure for determining coating rates

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Procedure for measuring coating rates

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Procedure for measuring the quantity of silicon coating on paper

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Procedure for monitoring contrast agent application in a CT imag

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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Process and apparatus for irradiating product pallets

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Process and apparatus for irradiating product pallets or...

X-ray or gamma ray systems or devices – Specific application – Absorption
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Process and apparatus for monitoring monocrystalline structures

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Process and apparatus for the continuous measurement of element

X-ray or gamma ray systems or devices – Specific application – Fluorescence
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Process and apparatus for the dimensional and non-destructive co

X-ray or gamma ray systems or devices – Specific application – Absorption
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Process and apparatus for the treatment of lesions by high frequ

X-ray or gamma ray systems or devices – Specific application – Absorption
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Process and circuit arrangement for testing solder joints

X-ray or gamma ray systems or devices – Specific application – Absorption
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Process and device for producing a radiographic image

X-ray or gamma ray systems or devices – Specific application – Computerized tomography
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