Process and apparatus for the continuous measurement of element

Details Process and apparatus for the continuous measurement of element Process and apparatus for the continuous measurement of element

1980-04-18

1983-06-14

Anderson, Bruce C.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

250358R, 250434, 378 83, G01N 2320, G21K 100

Patent

active

043885306

ABSTRACT:
A method and apparatus for continuous measurement, by X-ray fluorescence lysis, of the elemental content of a slurry, independently of slurry density and slurry composition. The slurry, a source of primary radiation, a target, and a detector are arranged so that the slurry passes between the source and the detector, and a portion of the primary radiation excites the elements in the slurry to emit elemental X-ray radiation. The primary radiation also excites the target, to emit target radiation which passes through the slurry. The primary, target, and elemental radiations are absorbed by the detector, and the absorbed radiations are evaluated to determine the elemental content of the slurry.

REFERENCES:
patent: 2999937 (1961-09-01), Kohler
patent: 3270200 (1966-08-01), Rhodes
patent: 3443092 (1969-05-01), Carr-Brin et al.
patent: 3746874 (1973-07-01), Ohata et al.
patent: 4125769 (1978-11-01), Marten et al.
patent: 4180735 (1979-12-01), Sipila et al.

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