4. Optics: measuring and testing
  Search
Selected: T
All A B C D E F G H I J K L M N O P Q R S
T
U V W X Y Z 0 1 2 3 4 5 6 7 8 9 ! " $ ' ( ) * , - / : < = > ? @ [ \ ] ^ ` { | } ~ €

Thickness measurement method and apparatus

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness measurement of moving webs and seal integrity...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness measuring apparatus for non-metallic sheet-shaped bodi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness measuring apparatus using light from slit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness measuring apparatus, substrate processing method,...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness measuring apparatus, thickness measuring method,...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness measuring apparatus, thickness measuring method,...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness measuring device for insulating glass

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness monitoring

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thickness/depth measuring apparatus and method for measuring the

Optics: measuring and testing – For optical fiber or waveguide inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin dielectric film measuring system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film flying height calibration disk for calibrating flying

Optics: measuring and testing – Standard
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film laser gyro

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film measuring device and method

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film optical measurement system and method with calibrating

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film optical measurement system and method with calibrating

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Thin film optical measurement system and method with...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure